LIMID Quality Control Models for Increasing Failure Rate Processes

Barry R. Cobb
Proceedings of The 12th International Conference on Probabilistic Graphical Models, PMLR 246:57-69, 2024.

Abstract

A Limited Memory Influence Diagram (LIMID) model for quality control that incorporates variable data on sample means from the output of a production process is introduced. The process operates over a finite production horizon and is out-of-control when the process mean for the output shifts. The probability such a shift occurs in the next time period is dependent on the elapsed time since the most recent process repair. A set of control limits that are adapted to the length the process has run without repair is selected to minimize quality control costs, and the sampling interval and sample size can be adjusted to further reduce costs if these modifications are operationally feasible. This is the first application of LIMIDs in a quality control model with an increasing rate of failure over time, and that implements variable data.

Cite this Paper

BibTeX
@InProceedings{pmlr-v246-cobb24a, title = {LIMID Quality Control Models for Increasing Failure Rate Processes}, author = {Cobb, Barry R.}, booktitle = {Proceedings of The 12th International Conference on Probabilistic Graphical Models}, pages = {57--69}, year = {2024}, editor = {Kwisthout, Johan and Renooij, Silja}, volume = {246}, series = {Proceedings of Machine Learning Research}, month = {11--13 Sep}, publisher = {PMLR}, pdf = {https://raw.githubusercontent.com/mlresearch/v246/main/assets/cobb24a/cobb24a.pdf}, url = {https://proceedings.mlr.press/v246/cobb24a.html}, abstract = {A Limited Memory Influence Diagram (LIMID) model for quality control that incorporates variable data on sample means from the output of a production process is introduced. The process operates over a finite production horizon and is out-of-control when the process mean for the output shifts. The probability such a shift occurs in the next time period is dependent on the elapsed time since the most recent process repair. A set of control limits that are adapted to the length the process has run without repair is selected to minimize quality control costs, and the sampling interval and sample size can be adjusted to further reduce costs if these modifications are operationally feasible. This is the first application of LIMIDs in a quality control model with an increasing rate of failure over time, and that implements variable data.} }
Endnote
%0 Conference Paper %T LIMID Quality Control Models for Increasing Failure Rate Processes %A Barry R. Cobb %B Proceedings of The 12th International Conference on Probabilistic Graphical Models %C Proceedings of Machine Learning Research %D 2024 %E Johan Kwisthout %E Silja Renooij %F pmlr-v246-cobb24a %I PMLR %P 57--69 %U https://proceedings.mlr.press/v246/cobb24a.html %V 246 %X A Limited Memory Influence Diagram (LIMID) model for quality control that incorporates variable data on sample means from the output of a production process is introduced. The process operates over a finite production horizon and is out-of-control when the process mean for the output shifts. The probability such a shift occurs in the next time period is dependent on the elapsed time since the most recent process repair. A set of control limits that are adapted to the length the process has run without repair is selected to minimize quality control costs, and the sampling interval and sample size can be adjusted to further reduce costs if these modifications are operationally feasible. This is the first application of LIMIDs in a quality control model with an increasing rate of failure over time, and that implements variable data.
APA
Cobb, B.R.. (2024). LIMID Quality Control Models for Increasing Failure Rate Processes. Proceedings of The 12th International Conference on Probabilistic Graphical Models, in Proceedings of Machine Learning Research 246:57-69 Available from https://proceedings.mlr.press/v246/cobb24a.html.

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