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When Can We Learn from Noisy Logical Data? Parameterized Complexity of Approximate Concept Fitting in Description Logics
Proceedings of the 42nd Conference on Uncertainty in Artificial Intelligence, PMLR 337:3979-3998, 2026.
Abstract
SAT-based bounded fitting—searching for a smallest logical concept that correctly classifies all given examples—yields sample-efficient {PAC} learning for structured hypothesis classes such as description logic (DL) concepts. Yet this paradigm is fundamentally brittle: it demands realizability, and a single mislabeled example can render the underlying SAT instance unsatisfiable. While agnostic learnability follows from finite VC-dimension of bounded-size concept classes, the real barrier is computational: minimizing misclassifications over all concepts of bounded size is NP-hard. We study this barrier through parameterized complexity. We introduce ApxFit(k,t)—the problem of deciding whether there exists a DL concept of size at most $k$ that misclassifies at most $t$ out of $m$ examples—and establish a complexity landscape for fragments of $\mathcal{ALC}$ whose operator sets contain $\{\sqcap,\exists\}$ or $\{\sqcup,\forall\}$: the problem is W[2]-hard parameterized by concept size $k$ (even for $t{=}0$), yet lies in XP parameterized by outlier count $t$ for any fixed $k$. Algorithmically, we lift bounded fitting from SAT to partial weighted MAX-SAT and combine it with structural risk minimization, yielding the first noise-tolerant DL concept learner with formal agnostic generalization guarantees.