A Bayesian Nonparametric Approach for Multi-label Classification

Vu Nguyen, Sunil Gupta, Santu Rana, Cheng Li, Svetha Venkatesh
Proceedings of The 8th Asian Conference on Machine Learning, PMLR 63:254-269, 2016.

Abstract

Many real-world applications require multi-label classification where multiple target labels are assigned to each instance. In multi-label classification, there exist the intrinsic correlations between the labels and features. These correlations are beneficial for multi-label classification task since they reflect the coexistence of the input and output spaces that can be exploited for prediction. Traditional classification methods have attempted to reveal these correlations in different ways. However, existing methods demand expensive computation complexity for finding such correlation structures. Furthermore, these approaches can not identify the suitable number of label-feature correlation patterns. In this paper, we propose a Bayesian nonparametric (BNP) framework for multi-label classification that can automatically learn and exploit the unknown number of multi-label correlation. We utilize the recent techniques in stochastic inference to derive the cheap (but efficient) posterior inference algorithm for the model. In addition, our model can naturally exploit the useful information from missing label samples. Furthermore, we extend the model to update parameters in an online fashion that highlights the flexibility of our model against the existing approaches. We compare our method with the state-of-the-art multi-label classification algorithms on real-world datasets using both complete and missing label settings. Our model achieves better classification accuracy while our running time is consistently much faster than the baselines in an order of magnitude.

Cite this Paper


BibTeX
@InProceedings{pmlr-v63-nguyen93, title = {A Bayesian Nonparametric Approach for Multi-label Classification}, author = {Nguyen, Vu and Gupta, Sunil and Rana, Santu and Li, Cheng and Venkatesh, Svetha}, booktitle = {Proceedings of The 8th Asian Conference on Machine Learning}, pages = {254--269}, year = {2016}, editor = {Durrant, Robert J. and Kim, Kee-Eung}, volume = {63}, series = {Proceedings of Machine Learning Research}, address = {The University of Waikato, Hamilton, New Zealand}, month = {16--18 Nov}, publisher = {PMLR}, pdf = {http://proceedings.mlr.press/v63/nguyen93.pdf}, url = {https://proceedings.mlr.press/v63/nguyen93.html}, abstract = {Many real-world applications require multi-label classification where multiple target labels are assigned to each instance. In multi-label classification, there exist the intrinsic correlations between the labels and features. These correlations are beneficial for multi-label classification task since they reflect the coexistence of the input and output spaces that can be exploited for prediction. Traditional classification methods have attempted to reveal these correlations in different ways. However, existing methods demand expensive computation complexity for finding such correlation structures. Furthermore, these approaches can not identify the suitable number of label-feature correlation patterns. In this paper, we propose a Bayesian nonparametric (BNP) framework for multi-label classification that can automatically learn and exploit the unknown number of multi-label correlation. We utilize the recent techniques in stochastic inference to derive the cheap (but efficient) posterior inference algorithm for the model. In addition, our model can naturally exploit the useful information from missing label samples. Furthermore, we extend the model to update parameters in an online fashion that highlights the flexibility of our model against the existing approaches. We compare our method with the state-of-the-art multi-label classification algorithms on real-world datasets using both complete and missing label settings. Our model achieves better classification accuracy while our running time is consistently much faster than the baselines in an order of magnitude.} }
Endnote
%0 Conference Paper %T A Bayesian Nonparametric Approach for Multi-label Classification %A Vu Nguyen %A Sunil Gupta %A Santu Rana %A Cheng Li %A Svetha Venkatesh %B Proceedings of The 8th Asian Conference on Machine Learning %C Proceedings of Machine Learning Research %D 2016 %E Robert J. Durrant %E Kee-Eung Kim %F pmlr-v63-nguyen93 %I PMLR %P 254--269 %U https://proceedings.mlr.press/v63/nguyen93.html %V 63 %X Many real-world applications require multi-label classification where multiple target labels are assigned to each instance. In multi-label classification, there exist the intrinsic correlations between the labels and features. These correlations are beneficial for multi-label classification task since they reflect the coexistence of the input and output spaces that can be exploited for prediction. Traditional classification methods have attempted to reveal these correlations in different ways. However, existing methods demand expensive computation complexity for finding such correlation structures. Furthermore, these approaches can not identify the suitable number of label-feature correlation patterns. In this paper, we propose a Bayesian nonparametric (BNP) framework for multi-label classification that can automatically learn and exploit the unknown number of multi-label correlation. We utilize the recent techniques in stochastic inference to derive the cheap (but efficient) posterior inference algorithm for the model. In addition, our model can naturally exploit the useful information from missing label samples. Furthermore, we extend the model to update parameters in an online fashion that highlights the flexibility of our model against the existing approaches. We compare our method with the state-of-the-art multi-label classification algorithms on real-world datasets using both complete and missing label settings. Our model achieves better classification accuracy while our running time is consistently much faster than the baselines in an order of magnitude.
RIS
TY - CPAPER TI - A Bayesian Nonparametric Approach for Multi-label Classification AU - Vu Nguyen AU - Sunil Gupta AU - Santu Rana AU - Cheng Li AU - Svetha Venkatesh BT - Proceedings of The 8th Asian Conference on Machine Learning DA - 2016/11/20 ED - Robert J. Durrant ED - Kee-Eung Kim ID - pmlr-v63-nguyen93 PB - PMLR DP - Proceedings of Machine Learning Research VL - 63 SP - 254 EP - 269 L1 - http://proceedings.mlr.press/v63/nguyen93.pdf UR - https://proceedings.mlr.press/v63/nguyen93.html AB - Many real-world applications require multi-label classification where multiple target labels are assigned to each instance. In multi-label classification, there exist the intrinsic correlations between the labels and features. These correlations are beneficial for multi-label classification task since they reflect the coexistence of the input and output spaces that can be exploited for prediction. Traditional classification methods have attempted to reveal these correlations in different ways. However, existing methods demand expensive computation complexity for finding such correlation structures. Furthermore, these approaches can not identify the suitable number of label-feature correlation patterns. In this paper, we propose a Bayesian nonparametric (BNP) framework for multi-label classification that can automatically learn and exploit the unknown number of multi-label correlation. We utilize the recent techniques in stochastic inference to derive the cheap (but efficient) posterior inference algorithm for the model. In addition, our model can naturally exploit the useful information from missing label samples. Furthermore, we extend the model to update parameters in an online fashion that highlights the flexibility of our model against the existing approaches. We compare our method with the state-of-the-art multi-label classification algorithms on real-world datasets using both complete and missing label settings. Our model achieves better classification accuracy while our running time is consistently much faster than the baselines in an order of magnitude. ER -
APA
Nguyen, V., Gupta, S., Rana, S., Li, C. & Venkatesh, S.. (2016). A Bayesian Nonparametric Approach for Multi-label Classification. Proceedings of The 8th Asian Conference on Machine Learning, in Proceedings of Machine Learning Research 63:254-269 Available from https://proceedings.mlr.press/v63/nguyen93.html.

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